The 2025 Executive Conference planning is underway, and committee positions are still available! Don’t miss your chance to contribute to this highly anticipated event by volunteering for one of three committees:
- Core Committee
- Sponsorship Subcommittee
- Speaker Vetting Subcommittee
Your input and ideas are vital to the success of the conference, shaping its content and quality. Volunteering is a fantastic way to connect with and learn from fellow industry professionals while making a lasting impact.
Save the date! The 2025 Executive Conference will take place October 19-21 at an exciting new venue, the Westin O'Hare.
For more information or to get involved, contact [email protected] today!
The following American National Standards are either in development as new standards or are going through the required ANSI 5-year review.
New Standards
EIA-364-1006 Environmental Test Methodology for Assessing the Performance of Electrical Connectors and Sockets Used in Single Phase Immersion Cooling Applications
Standards Under Review (for Reaffirmation or Revision)
EIA-296-F Lead Taping of Components in Axial Lead Configuration for Automatic Handling
EIA-364-11C Resistance to Solvents Test Procedure for Electrical Connectors and Sockets
EIA-364-26C Salt Spray Test Procedure for Electrical Connectors, Contacts and Sockets
EIA-364-49 Ultraviolet Radiation Test Procedure for Electrical Connectors and Sockets
EIA-364-51B Ice Resistance Test Procedure for Electrical Connectors
EIA-364-61A Resistance to Soldering Heat from Rework Test Procedure for Electrical Connectors and Sockets Mounted on Printed Circuit Boards
EIA-364-63 Accessory Thread Strength Test Procedure for Circular Electrical Connectors
EIA-364-64 Spring Finger Force Test Procedure for Circular Connectors
EIA-364-90A Crosstalk Ratio Test Procedures for Electrical Connectors, Sockets, Cable Assemblies or Interconnect Systems
EIA-364-107A Eye Pattern and Jitter Test Procedure for Electrical Connectors, Sockets, Cable Assemblies or Interconnection Systems
EIA-364-108A Impedance, Reflection Coefficient, Return Loss, and VSWR Measured in the Time and Frequency Domain Test Procedure for Electrical Connectors, Cable Assemblies or Interconnection Systems
EIA-364-110 Thermal Cycling Test Procedure for Electrical Connectors and Sockets
EIA-364-120 Electrolytic Erosion Test Procedure for Electrical Connectors
EIA-575-C Resistors, Thick Film Rectangular SMD on Ceramic
EIA-576-C Resistors, Thin Film Rectangular SMD on Ceramic
EIA-703-C General Resistor Stress Test Qualification Specification
EIA-747-C Adhesive backed punched plastic carrier taping of singulated bare die and other surface mount components for automatic handling of devices generally less than 1.0 mm thick
EIA-797 Aluminum-Electrolytic Capacitor Application Guideline
EIA-886-B Resistors, Thick Film Array on Ceramic
EIA-944 Surface Mount Chip Bead Qualification Specification
Joint Standards
J-STD-046 Customer Notification Standard for Product/Process Changes by Electronic Product Suppliers
J-STD-75A Classification of Passive and Solid State Devices for Assembly Processes
JESD50D Special Requirements for Maverick Product Elimination and Outlier Management
Anyone with technical expertise or general knowledge of these technologies is invited to provide input. Please contact Ed Mikoski or Laura Donohoe for more information.
